Nuclear Instruments and Methods · 1978 · 24 citations · 6 references
EngineeringMaterials EngineeringMaterials ScienceElectronic MaterialsSemiconductor DevicesSurface ScienceChannel StructureDevice ModelingDevice SimulationIntegrated Circuit DesignInterface ModelingMetal-semiconductor ContactsChannel EngineeringChannelingLayer-based FabricationSilicide ContactsStructure-property Modeling
6
Max Hansen, K. Anderko, H. W. Salzberg · Journal of The Electrochemical Society · 1958 · 14.8K citations
Channeling of MeV Projectiles in Tungsten and Silicon
John Davies, J. Denhartog, J. L. Whitton · Physical Review · 1968 · 140 citations
Characterization of polycrystalline layers by channelling measurements
D. Sigurd, R.W. Bower, W. F. van der Weg et al. · Thin Solid Films · 1973 · 65 citations
Natural Sciences, Materials Engineering, Materials Science +12