Characterization of polycrystalline layers by channelling measurements

Channeling of medium-mass ions through silicon

F. H. Eisen · Canadian Journal of Physics · 1968 · 209 citations

Natural Sciences, Materials Science, Physics +11

Channeling Studies in Diamond-Type Lattices

S. T. Picraux, John Davies, L. Eriksson et al. · Physical Review · 1969 · 126 citations

Natural Sciences, Materials Science, Physics +9

Structure and electrical characteristics of epitaxial palladium silicide contacts on single crystal silicon and diffused P-N diodes

W. D. Buckley, Steven C. Moss · Solid-State Electronics · 1972 · 117 citations

Engineering, Electrical Engineering, Materials Science +17

Metallurgical properties and electrical characteristics of palladium silicide-silicon contacts

C. J. Kircher · Solid-State Electronics · 1971 · 115 citations

Engineering, Materials Engineering, Materials Science +16

Analysis of disorder distributions in boron implanted silicon

J.E. Westmoreland, J. W. Mayer, F. H. Eisen et al. · Radiation Effects · 1970 · 94 citations

Engineering, Materials Engineering, Materials Science +12