Microelectronics Reliability · 2012 · 44 citations · 9 references
EngineeringAerospace EngineeringElectrical EngineeringAerospace MaterialsMicroelectronicsSemiconductor DevicesAircraft Electrical SystemsDevice CharacterizationDevice ReliabilityElectronics TechnologySemiconductor ReliabilityShort-channel EffectsGate Oxide Thickness EffectsGate-dependent Current-voltage BehaviorMosfet ModelingPower MosfetsSilicon Carbide (Sic) MaterialsSilicon Carbide Power DevicesSilicon Carbide Power Electronics
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Investigation of 1.2 kV SiC MOSFET for high frequency high power applications
Honggang Sheng, Zheng Chen, Fred Wang et al. · 2010 · 91 citations · Full text
Robustness of SiC JFET in Short-Circuit Modes
N. Boughrara, N. Boughrara, S. Moumen et al. · IEEE Electron Device Letters · 2008 · 41 citations