Concepedia

Publication | Closed Access

Comparison study on performances and robustness between SiC MOSFET & JFET devices – Abilities for aeronautics application

DOI

44

Citations

9

References

2012

Year

D. Othman, Mounira Berkani, Sébastien Lefebvre, Ali Ibrahim, Z. Khatir, A. Bouzourene
Microelectronics Reliability

References

YearCitations

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