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Publications
1
Citations
41
H-Index
1
Active since
2008
S. Moumen is an author at Laboratoire des systèmes et applications des technologies de l'information et de l'énergie specializing in device reliability, microelectronics, and reliability degradation mechanisms.
Publications per year
2008–2008
1
1
Robustness of SiC JFET in Short-Circuit Modes
N. Boughrara, N. Boughrara, S. Moumen et al. · IEEE Electron Device Letters · 2008 · 41 citations
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