Assessment of oxide reliability and hot carrier degradation in CMOS technology - Concepedia

Concepedia

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Assessment of oxide reliability and hot carrier degradation in CMOS technology

12

Citations

50

References

1998

Year

H.E. Maes, G. Groeseneken, R. Degraeve, J. De Blauwe, G. Van den bosch

Microelectronic Engineering

Electrical EngineeringReliability EngineeringEngineeringHot Carrier DegradationHardware ReliabilityOxide ReliabilityBias Temperature InstabilityCmos TechnologyCircuit ReliabilityDevice ReliabilityMicroelectronics

References

	Year	Citations

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