Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 1999 · 44 citations · 20 references
Natural SciencesMaterials SciencePhysicsElectronic MaterialsPlasma PhysicsSemiconductor DevicesHigh-temperature PlasmasPlasma SourcesSemiconductor Crystal GrowthElectrical PropertiesElectrical Properties AnalysisGallium Nitride (Gan) MaterialsMolecular Beam EpitaxyMolecular Beam Epitaxy KineticsNitrogen SpeciationTemperature DependenceThermal Decomposition
A reduced growth rate for plasma-assisted molecular beam epitaxy GaN growth often limits growth to temperatures less than 750 °C. The growth rate reduction is significantly larger than expected based on thermal decomposition. Characterization of various rf plasma source configurations indicated that a flux consisting predominantly of either atomic nitrogen or nitrogen metastables can be produced. The use of atomic nitrogen, possibly coupled with the presence of low energy ions, is associated with the premature decrease in growth rate. When the active nitrogen flux consists primarily of nitrogen metastables, the temperature dependence of the decrease is more consistent with decomposition rates. A significant improvement in electrical properties is observed for growth with molecular nitrogen metastables. In addition, atomic hydrogen stabilizes the growing surface of (0001_) GaN.
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Growth of GaN by ECR-assisted MBE
T. D. Moustakas, Ting Lei, R. J. Molnar · Physica B Condensed Matter · 1993 · 236 citations · Full text
Polarity of (00.1) GaN epilayers grown on a (00.1) sapphire
M. Seelmann‐Eggebert, J.L. Weyher, H. Obloh et al. · Applied Physics Letters · 1997 · 185 citations
Natural Sciences, Materials Engineering, Materials Science +17