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Reliability of Wire Bonding on Low-k Dielectric Material in Damascene Copper Integrated Circuits PBGA Assembly

Mohandass Sivakumar, V. Kripesh, Chong Ser Choong, Chai Tai Chong, Loon Aik Lim

Microelectronics Reliability · 2002 · 13 citations · 0 references

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