Materials Science in Semiconductor Processing · 2014 · 21 citations · 17 references
EngineeringElectrical EngineeringElectronic MaterialsMicroelectronicsSemiconductor DevicesDevice CharacterizationHigh-frequency Semiconductor DevicesIntegrated Circuit DesignMetal-oxide-semiconductor Field-effect TransistorsMicrowave Semiconductor DevicesRadio-frequency Integrated CircuitsDepletion RegionDepletion Region EngineeringDepletion-mode TransistorsDevice OptimizationGate Oxide Thickness EffectsHigh-electron-mobility Transistors
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Improved performance of SiC MESFETs using double-recessed structure
C.L. Zhu, Rusli Rusli, C. C. Tin et al. · Microelectronic Engineering · 2005 · 77 citations