The use of the focused ion beam technique to prepare cross-sectional transmission electron microscopy specimen of polymer solar cells deposited on glass

Electroluminescence in conjugated polymers

Richard H. Friend, R. W. Gymer, Andrew B. Holmes et al. · Nature · 1999 · 6K citations

Natural Sciences, Materials Engineering, Materials Science +12

Applications of the FIB lift-out technique for TEM specimen preparation

Lucille A. Giannuzzi, J. L. Drown, Steve R Brown et al. · Microscopy Research and Technique · 1998 · 296 citations · Full text

Engineering, Materials Engineering, Materials Science +14

Applications of focused ion beam microscopy to materials science specimens

M. W. Phaneuf · Micron · 1999 · 264 citations

Natural Sciences, Materials Engineering, Materials Science +6

Novel scheme for the preparation of transmission electron microscopy specimens with a focused ion beam

M.H.F. Overwijk, F.C. van den Heuvel, C. W. T. Bulle‐Lieuwma · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 1993 · 258 citations

Engineering, Electrical Engineering, Materials Science +12

A 100-kV ion probe microfabrication system with a tetrode gun

J. R. A. Cleaver, H. Ahmed · Journal of Vacuum Science and Technology · 1981 · 34 citations

Engineering, Nuclear Engineering, Instrumentation +7