J. R. A. Cleaver - Concepedia

Author

J. R. A. Cleaver

Also Known As

J R A Cleaver, J. R. A CLEAVER, J. R. A. CLEAVER, J. R. A. Cleaver, J. R. Cleaver, J.R.A. Cleaver, Jacob Cleaver, Joshua Cleaver

124

Publications

1.7K

Citations

H-Index

102

Concepts

All Affiliations

University of Cambridge Cambridge Microelectronics (United Kingdom)Hitachi (United Kingdom)Bridge University Hitachi (Japan)

About

J. R. A. Cleaver is an author at University of Cambridge specializing in engineering, applied physics, and physics.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	23	47	1.4K
2	Applied Physics	22	44	1.3K
3	Natural Sciences	2	2	77
4	Medicine	1	1	29
5	Biomedical Engineering	1	1	34

J. R. A. Cleaver

Publications

1.5K

Citations

H-Index

Page 1

	Year	Citations
Diffusion controlled growth of metallic nanoclusters at selected surface sites Gareth M. Francis, L. Kuipers, J. R. A. Cleaver, Journal of Applied Physics EngineeringNanoclusterMetal NanoparticlesNanostructured SurfaceAtomic Steps	1996	94
Electron beam induced deposition from W(CO)6 at 2 to 20 keV and its applications P. C. Hoyle, J. R. A. Cleaver, H. Ahmed Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena Materials ScienceSemiconductorsIon ImplantationEngineeringElectron-beam Lithography	1996	93
Single-electron memory Kazuhiko Nakazato, Richard J. Blaikie, J. R. A. Cleaver, Electronics Letters Electrical EngineeringElectronic DevicesSingle-electron Memory CellEngineeringElectronic Memory	1993	91
Characteristics of gas-assisted focused ion beam etching Richard Young, J. R. A. Cleaver, H. Ahmed Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena Materials ScienceMaterials EngineeringElectrical EngineeringIon ImplantationEngineering	1993	81
Gateable Suppression of Spin Relaxation in Semiconductors Jagdeep Singh Sandhu, A. P. Heberle, Jeremy J. Baumberg, Physical Review Letters SemiconductorsSpintronicsQuantum ScienceEngineeringPhysics	2001	62
Electrically pumped single-photon sources in lateral p-i-n junctions Xiulai Xu, D. A. Williams, J. R. A. Cleaver Applied Physics Letters Quantum PhotonicsEngineeringSingle Quantum DotSemiconductorsBiexciton Emission	2004	51
Direct observation of the structure of a metallic alloy glass Philip Gaskell, David J. Smith, Cyril Catto, Nature Materials ScienceGlass-ceramicEngineeringGlass-forming LiquidMechanical Engineering	1979	49
Optimisation and applications of the Cambridge University 600 kV high resolution electron microscope David J. Smith, R. A. Camps, V. E. Cosslett, Ultramicroscopy EngineeringElectron MicroscopyPhysicsMicroscopyMicroscopy Method	1982	49
Ultralow-energy focused electron beam induced deposition P. C. Hoyle, J. R. A. Cleaver, H. Ahmed Applied Physics Letters Materials EngineeringMaterials ScienceX-ray SpectroscopyFocused Electron BeamPhysics	1994	46
Application of a focused ion beam system to defect repair of VLSI masks P.J. Heard, J. R. A. Cleaver, H. Ahmed Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena Ion ImplantationEngineeringElectron-beam LithographyBeam LithographyMicrofabrication	1985	45

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