Thermally-driven motion of current filaments in ESD protection devices

Avalanche Breakdown in Silicon

K. G. McKay · Physical Review · 1954 · 478 citations

Engineering, Electrical Engineering, Physics +16

ESD in silicon integrated circuits

Microelectronics Reliability · 1996 · 442 citations

Engineering, Electrical Engineering, Microelectronics +9

Analysis of lateral DMOS power devices under ESD stress conditions

M. Mergens, W. Wilkening, S. Mettler et al. · IEEE Transactions on Electron Devices · 2000 · 124 citations

Engineering, Electrical Engineering, Microelectronics +16

Criteria for stability in bistable electrical devices with S- or Z-shaped current voltage characteristic

A. Wacker, Eckehard Schöll · Journal of Applied Physics · 1995 · 78 citations

Engineering, Electrical Engineering, Circuit Theory +13

Spontaneous appearance of rocking localized current filaments in a nonequilibrium distributive system

F.‐J. Niedernostheide, Boris S. Kerner, H.‐G. Purwins · Physical review. B, Condensed matter · 1992 · 72 citations

Natural Sciences, Electrical Engineering, Physics +9