Amplitude or frequency modulation-detection in Kelvin probe force microscopy

Frequency modulation detection using high-<i>Q</i> cantilevers for enhanced force microscope sensitivity

T. R. Albrecht, Peter Grütter, Don Horne et al. · Journal of Applied Physics · 1991 · 2.4K citations

Engineering, Bioengineering, Mechanical Engineering +16

Forces and frequency shifts in atomic-resolution dynamic-force microscopy

Franz J. Gießibl · Physical review. B, Condensed matter · 1997 · 683 citations · Full text

Natural Sciences, Biophysics, Physics +16

Resolution and contrast in Kelvin probe force microscopy

Heiko O. Jacobs, P. Leuchtmann, O.J. Homan et al. · Journal of Applied Physics · 1998 · 469 citations

Natural Sciences, Biophysics, Materials Science +17

High resolution atomic force microscopy potentiometry

Jonathan Weaver, David W. Abraham · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 1991 · 405 citations

Natural Sciences, Electrical Engineering, Materials Science +15

High-resolution imaging of contact potential difference with ultrahigh vacuum noncontact atomic force microscope

Shinichi Kitamura, Masashi Iwatsuki · Applied Physics Letters · 1998 · 301 citations

Natural Sciences, Materials Science, Physics +17