O.J. Homan

Resolution and contrast in Kelvin probe force microscopy

Heiko O. Jacobs, P. Leuchtmann, O.J. Homan et al. · Journal of Applied Physics · 1998 · 467 citations

Engineering, Kelvin Probe Technology, Microscopy +17

Investigation of the cleaved surface of a p–i–n laser using Kelvin probe force microscopy and two-dimensional physical simulations

F. Robin, Heiko O. Jacobs, O.J. Homan et al. · Applied Physics Letters · 2000 · 57 citations

Laser Processing (Laser Material Processing), Engineering, Microscopy +26

Mode spectroscopy and level coupling in ballistic electron waveguides

Gian Salis, T. Heinzel, K. Ensslin et al. · Physical review. B, Condensed matter · 1999 · 26 citations · Full text

Quantum Science, Spintronics, Engineering +15

Simulation and evolutionary optimization of electron-beam lithography with genetic and simplex-downhill algorithms

F. Robin, A. Orzati, Esteban Moreno et al. · IEEE Transactions on Evolutionary Computation · 2003 · 20 citations

Electrical Engineering, Engineering, Electron-beam Lithography +13

A 110-GHz large-signal lookup-table model for InP HEMTs including impact ionization effects

A. Orzati, Dominique Schreurs, Luca Pergola et al. · IEEE Transactions on Microwave Theory and Techniques · 2003 · 19 citations

High Resolution, Engineering, Radio Frequency +18