Heiko O. Jacobs

Resolution and contrast in Kelvin probe force microscopy

Heiko O. Jacobs, P. Leuchtmann, O.J. Homan et al. · Journal of Applied Physics · 1998 · 467 citations

Engineering, Kelvin Probe Technology, Microscopy +17

Fabrication of a Cylindrical Display by Patterned Assembly

Heiko O. Jacobs, Andrea R. Tao, Alexander Schwartz et al. · Science · 2002 · 391 citations

Engineering, Integrated Semiconductor Devices, Biomedical Engineering +21

Submicrometer Patterning of Charge in Thin-Film Electrets

Heiko O. Jacobs, George M. Whitesides · Science · 2001 · 369 citations

Engineering, Thin-film Electrets, Thin Film Process Technology +18

Molecular Rectification in a Metal−Insulator−Metal Junction Based on Self-Assembled Monolayers

Michael L. Chabinyc, Xiaoxi Chen, R. Erik Holmlin et al. · Journal of the American Chemical Society · 2002 · 247 citations

Practical aspects of Kelvin probe force microscopy

Heiko O. Jacobs, H. Knapp, Andreas Stemmer · Review of Scientific Instruments · 1999 · 214 citations

Engineering, Microscopy, Practical Aspects +19