Masashi Iwatsuki - Concepedia

Author

Masashi Iwatsuki

Also Known As

Iwatsuki, Masashi, M Iwatsuki, M. Iwatsuki, MASASHI IWATSUKI, Masashi IWATSUKI, Masashi Iwatsuki, Masashi Iwatsuki Masashi Iwatsuki

Publications

1.9K

Citations

H-Index

Concepts

All Affiliations

JEOL (Japan)Hokkaido University Hiroshima University Hitachi (Japan)Kanazawa Institute of Technology

About

Masashi Iwatsuki is an author at JEOL (Japan) specializing in applied physics, engineering, and surface science.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	19	31	1.8K
2	Applied Physics	19	32	1.8K
3	Medicine	4	4	132
4	Natural Sciences	3	3	419
5	Biomedical Engineering	2	2	33

Masashi Iwatsuki

Publications

1.8K

Citations

H-Index

Page 1

	Year	Citations
Observation of 7×7 Reconstructed Structure on the Silicon (111) Surface using Ultrahigh Vacuum Noncontact Atomic Force Microscopy Shinichi Kitamura, Masashi Iwatsuki Japanese Journal of Applied Physics EngineeringNc AfmUltrahigh VacuumMicroscopyTunneling Microscopy	1995	338
High-resolution imaging of contact potential difference with ultrahigh vacuum noncontact atomic force microscope Shinichi Kitamura, Masashi Iwatsuki Applied Physics Letters EngineeringUltrahigh VacuumMicroscopyHigh-resolution ImagingElectron Microscopy	1998	301
Observation of surface reconstruction on silicon above 800 °C using the STM Shinichi Kitamura, Tomoshige Sato, Masashi Iwatsuki Nature Materials ScienceEngineeringSurface AnalysisSurface ScienceApplied Physics	1991	155
Low-temperature scanning-tunneling-microscopy observations of the Si(001) surface with a low surface-defect density Hiroshi Tochihara, T. Amakusa, Masashi Iwatsuki Physical review. B, Condensed matter EngineeringSilicon On InsulatorAsymmetric-dimer ModelTunneling MicroscopySurface Dimers	1994	118
Observation of Silicon Surfaces Using Ultrahigh-Vacuum Noncontact Atomic Force Microscopy Shin'ichi Kitamura Shin'ichi Kitamura, Masashi Iwatsuki Japanese Journal of Applied Physics EngineeringNoncontact ImagingUltrahigh VacuumMicroscopyVacuum Device	1996	88
High resolution imaging of contact potential difference using a novel ultrahigh vacuum non-contact atomic force microscope technique Shinichi Kitamura, Katsuyuki Suzuki, Masashi Iwatsuki Applied Surface Science EngineeringElectron MicroscopyPhysicsMicroscopyMicrofabrication	1999	85
Atomic-scale variations in contact potential difference on Au/Si(111) 7×7 surface in ultrahigh vacuum Shinichi Kitamura, Katsuyuki Suzuki, Masashi Iwatsuki, Applied Surface Science Materials ScienceSurface CharacterizationEngineeringUltrahigh VacuumSurface Analysis	2000	80
Surface diffusion of adsorbed Si atoms on the Si(111)7×7 surface studied by atom-tracking scanning tunneling microscopy Tomoshige Sato, Shinichi Kitamura, Masashi Iwatsuki Journal of Vacuum Science & Technology A Vacuum Surfaces and Films Materials ScienceSemiconductorsSurface CharacterizationEngineeringTunneling Microscopy	2000	67
Initial adsorption process of Si atoms on an Si(111)7×7 surface studied by scanning tunneling microscopy Tomoshige Sato, Shinichi Kitamura, Masashi Iwatsuki Surface Science Surface CharacterizationEngineeringTunneling MicroscopyPhysicsSurface Analysis	2000	53
High-temperature scanning tunneling microscopy study of the ‘16×2’⇔(1×1) phase transition on an Si(110) surface Youiti Yamamoto, Takashi Sueyoshi, Tomoshige Sato, Surface Science Materials ScienceSurface CharacterizationEngineeringTunneling MicroscopyPhysics	2000	47

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