Electrochimica Acta · 2004 · 13 citations · 58 references
EngineeringElectrical EngineeringMaterials ScienceSemiconductor DevicesSemiconductor MaterialsSpectroscopyDevice CharacterizationElectrode MaterialsImpedance SpectroscopySemiconductor Device MaterialsSemiconductor InterfacesSemiconductor PhysicsElectrode Impedance CharacterizationHarmonic GenerationSecond Harmonic Generation SpectroscopySecond-harmonic GenerationSemiconductor Impedance Spectroscopy
58
Deep-level optical spectroscopy in GaAs
A. Chantre, G. Vincent, D. Bois · Physical review. B, Condensed matter · 1981 · 455 citations
Identification of AsGa antisites in plastically deformed GaAs
E. R. Weber, H. Ennen, U. Kaufmann et al. · Journal of Applied Physics · 1982 · 387 citations
Natural Sciences, Materials Engineering, Materials Science +17