Chip Scale Camera Module (CSCM) using Through-Silicon-Via (TSV)

Hiroshi Yoshikawa, A. Kawasaki, Tomoaki, Iiduka, Yasushi Nishimura, Kazumasa Tanida, K. Akiyama, Masahiro Sekiguchi, Mie Matsuo, Satoru Fukuchi,

2009 · 55 citations · 2 references

Concepts

Abstract

Through silicon via (TSV) is one of the necessary technologies for three-dimensional integration of LSIs. Heterogeneous system integration is a good candidate for its application, which includes the "Vision Chip". TSV technology is applied to a CMOS imager sensor camera module for mobile handsets and successfully achieves a size reduction of 55% in volume and 36% in footprint, which we refer to as a chip scale camera module (CSCM). To the best of the authors' knowledge, CSCM is the first mass-produced product using TSV technology.

References

2