Concepedia

X-ray double crystal and X-ray topographic characterization of silicon carbide thin films on silicon, titanium carbide, 6H-silicon carbide, and aluminum nitride/sapphire substrates

J. Chaudhuri, R. Thokala, James H. Edgar, B. S. Sywe

Thin Solid Films · 1996 · 14 citations · 19 references

Concepts

EngineeringMaterials EngineeringMaterials ScienceMaterials CharacterizationSemiconductor MaterialsThin FilmsSemiconductor Device MaterialsSemiconductor SurfacesSilicon MaterialsX-ray CrystallographyX-ray DiffractionX-ray SpectroscopyAluminum NitrideSemiconductor CharacterizationSilicon CarbideSilicon Carbide (Sic) MaterialsSilicon Thin FilmsX-ray ReflectivityX-ray Topography

References

19

Physical Properties of Crystals

Materials Today · 2007 · 7.8K citations · Full text

Natural Sciences, Mathematics, Physics +14

Analysis of Bi-Metal Thermostats

S. Timoshenko · Journal of the Optical Society of America · 1925 · 2.4K citations

Natural Sciences, Materials Science, Physics +7

Comparison of 6H-SiC, 3C-SiC, and Si for power devices

M. Bhatnagar, B. Jayant Baliga · IEEE Transactions on Electron Devices · 1993 · 1.1K citations

Engineering, Electrical Engineering, Materials Science +17

Production of large-area single-crystal wafers of cubic SiC for semiconductor devices

Shigehiro Nishino, J. A. Powell · Applied Physics Letters · 1983 · 926 citations

Engineering, Materials Engineering, Materials Science +17

Precision lattice constant determination

W. L. Bond · Acta Crystallographica · 1960 · 703 citations · Full text

Natural Sciences, Chemistry, Crystal Structure +11