X-ray Reflectivity
X-Ray Reflectivity is a non-destructive analytical technique in surface science that measures the intensity of X-rays reflected from a material surface as a function of incidence angle to determine nanoscale structural properties such as film thickness, density, and interfacial roughness.
3.2K
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149.7K
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9.7K
Authors
1.6K
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Publications per year
2017–2026
323
Variants
Xrr
Parents
3.2K
Surface Studies of Solids by Total Reflection of X-Rays
L. G. Parratt · Physical Review · 1954 · 5.1K citations
Small-Angle Scattering of X-Rays
AIBS Bulletin · 1956 · 3.9K citations
Natural Sciences, Physics, Optics +10
Phase-contrast imaging of weakly absorbing materials using hard X-rays
Timothy J. Davis, D. Gao, Timur E. Gureyev et al. · Nature · 1995 · 1K citations
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1.6K
Argonne National Laboratory
Lemont, United States
55 h-index
553 publications
27.8K citations

Brookhaven National Laboratory
Upton, United States
42 h-index
370 publications
33.6K citations

European Synchrotron Radiation Facility
Grenoble, France
39 h-index
355 publications
20.1K citations

Centre National de la Recherche Scientifique
Paris, France
36 h-index
543 publications
17.2K citations

Lawrence Berkeley National Laboratory
Berkeley, United States
33 h-index
184 publications
7.2K citations
University of Illinois Chicago
Chicago, United States
32 h-index
160 publications
15.2K citations
Harvard University
Cambridge, United States
31 h-index
203 publications
22.5K citations
Northwestern University
Evanston, United States
31 h-index
312 publications
25.3K citations
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PRL · 84 publications · 9.4K citations
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189 publications · 9.4K citations
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PRB · 102 publications · 6.8K citations
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165 publications · 6.1K citations
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198 publications · 7.3K citations
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