X-ray Reflectivity

X-Ray Reflectivity is a non-destructive analytical technique in surface science that measures the intensity of X-rays reflected from a material surface as a function of incidence angle to determine nanoscale structural properties such as film thickness, density, and interfacial roughness.

3.2K

Publications

149.7K

Citations

9.7K

Authors

1.6K

Institutions

Publications per year

2017–2026

323

Authors

9.7K

  1. PF
    Paul Fenter

    Argonne National Laboratory, United States

    55 publications · 4K citations

    34

    h-index

  2. BM
    B. M. Ocko

    Brookhaven National Laboratory, United States

    57 publications · 5.9K citations

    32

    h-index

  3. MD
    Moshe Deutsch

    Bar-Ilan University, Israel

    43 publications · 4.3K citations

    29

    h-index

  4. PS
    P. S. Pershan

    Harvard University, United States

    42 publications · 3.6K citations

    28

    h-index

  5. ML
    Mark L. Schlossman

    University of Illinois Chicago, United States

    28 publications · 1.6K citations

    23

    h-index

1–5 of 9.7K

Venues

  1. Physical Review Letters

    PRL · 84 publications · 9.4K citations

    54

    h-index

  2. Langmuir

    189 publications · 9.4K citations

    50

    h-index

  3. Physical review. B, Condensed matter

    PRB · 102 publications · 6.8K citations

    45

    h-index

  4. Applied Physics Letters

    165 publications · 6.1K citations

    44

    h-index

  5. Journal of Applied Physics

    198 publications · 7.3K citations

    43

    h-index

1–5