R. Thokala

Calculated elastic constants of wide band gap semiconductor thin films with a hexagonal crystal structure for stress problems

R. Thokala, J. Chaudhuri · Thin Solid Films · 1995 · 59 citations

Natural Sciences, Materials Science, Physics +16

X-ray double crystal characterization of single crystal epitaxial aluminum nitride thin films on sapphire, silicon carbide and silicon substrates

J. Chaudhuri, R. Thokala, James H. Edgar et al. · Journal of Applied Physics · 1995 · 42 citations

Natural Sciences, Materials Engineering, Materials Science +17

Reduced temperature growth of crystalline 3C-SiC films on 6H-SiC by chemical vapor deposition from silacyclobutane

Cailei Yuan, A. J. Steckl, J. Chaudhuri et al. · Journal of Applied Physics · 1995 · 15 citations

Natural Sciences, Materials Engineering, Materials Science +14

X-ray double crystal and X-ray topographic characterization of silicon carbide thin films on silicon, titanium carbide, 6H-silicon carbide, and aluminum nitride/sapphire substrates

J. Chaudhuri, R. Thokala, James H. Edgar et al. · Thin Solid Films · 1996 · 14 citations

Engineering, Materials Engineering, Materials Science +16