Concepedia

On-Orbit Error Rates of RHBD SRAMs: Comparison of Calculation Techniques and Space Environmental Models With Observed Performance

A. Bogorad, Justin J. Likar, Robert E. Lombardi, Stephen E. Stone, Roman Herschitz

IEEE Transactions on Nuclear Science · 2011 · 24 citations · 12 references

Abstract

SEU data for more than 250 equivalent on-orbit SRAM device years is compared with upset rate calculations using various environmental models and contributions of both direct ionization and nuclear interactions.

References

12

Impact of Low-Energy Proton Induced Upsets on Test Methods and Rate Predictions

Brian D. Sierawski, Jonathan A. Pellish, Robert A. Reed et al. · IEEE Transactions on Nuclear Science · 2009 · 194 citations

Engineering, Computer Engineering, Electrical Engineering +14

The contribution of nuclear reactions to heavy ion single event upset cross-section measurements in a high-density SEU hardened SRAM

Kevin M. Warren, Robert A. Weller, Marcus H. Mendenhall et al. · IEEE Transactions on Nuclear Science · 2005 · 173 citations

Engineering, Electrical Engineering, Physics +17

Badhwar–O'Neill 2010 Galactic Cosmic Ray Flux Model—Revised

Patrick M. O'Neill · IEEE Transactions on Nuclear Science · 2010 · 166 citations

Natural Sciences, Astronomy, Physics +10

Single-Event Upsets and Multiple-Bit Upsets on a 45 nm SOI SRAM

David F. Heidel, Paul W. Marshall, Jonathan A. Pellish et al. · IEEE Transactions on Nuclear Science · 2009 · 163 citations

Engineering, Computer Engineering, Electrical Engineering +8

Low Energy Proton Single-Event-Upset Test Results on 65 nm SOI SRAM

David F. Heidel, Paul W. Marshall, Kenneth A. LaBel et al. · IEEE Transactions on Nuclear Science · 2008 · 157 citations

Engineering, Computer Engineering, Electrical Engineering +15

On-Orbit Error Rates of RHBD SRAMs: Comparison of Calculation Techniques and Space Environmental Models With Observed Performance

Concepts

Abstract

References