Applied Physics Letters · 1994 · 41 citations · 21 references
EngineeringElectrical EngineeringMaterials ScienceOptoelectronicsSemiconductor DevicesSemiconductor MaterialsLaser DiodesLaser PhysicsSemiconductor Device MaterialsSemiconductor HeterostructuresSemiconductor LasersSemiconductor PhysicsDiode Laser Threshold CurrentDouble Heterostructure DevicesDouble HeterostructuresHeterostructure LasersHigh-power Semiconductor LasersMolecular Beam EpitaxyPower OutputPulsed Operation
Double-heterostructure diode lasers emitting at ∼3.9 μm have exhibited pulsed operation at temperatures up to 170 K and cw operation up to 105 K, with single-ended cw output power of 30 mW at 70 K. The laser structure, grown on GaSb substrates by molecular-beam epitaxy, has an InAsSb active layer and AlAsSb cladding layers. The lowest pulsed threshold current density is 36 A/cm2 obtained at 60 K. The characteristic temperature is 20 K over the entire temperature range.
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HgCdTe infrared diode lasers grown by MBE
J. M. Arias, M. Zandian, R. Zucca et al. · Semiconductor Science and Technology · 1993 · 78 citations