Concepedia

Characterisation of trapped electric charge carriers behaviour at nanometer scale by electrostatic force microscopy

F. Marchi, R. Dianoux, H. J. H. Smilde, P. Mur, F. Comin, Joël Chevrier

Journal of Electrostatics · 2008 · 44 citations · 36 references

DOI

Concepts

References

36

Kelvin probe force microscopy

M. Nonnenmacher, M. O’Boyle, H. K. Wickramasinghe · Applied Physics Letters · 1991 · 2.3K citations

, , +17

Single-electron devices and their applications

K. K. Likharev · Proceedings of the IEEE · 1999 · 1.5K citations

, , +14

Atomic force microscope–force mapping and profiling on a sub 100-Å scale

Y. Martin, C. C. Williams, H. K. Wickramasinghe · Journal of Applied Physics · 1987 · 1.4K citations

, , +17

Contact electrification using force microscopy

B. D. Terris, J. E. Stern, D. Rugar et al. · Physical Review Letters · 1989 · 530 citations

, , +17

Self-Assembly of Ordered, Robust, Three-Dimensional Gold Nanocrystal/Silica Arrays

Hongyou Fan, Kai Yang, D.M. Boye et al. · Science · 2004 · 471 citations

, , +16