Contact electrification using force microscopy

Abstract

One of the oldest unresolved problems in physics is the mechanism of charge exchange between contacting surfaces when at least one of them is insulating. We describe a new technique, using force microscopy, for studying this problem with greater lateral resolution than has been previously possible. The force microscope is shown to have 0.2 \ensuremath{\mu}m lateral resolution and the sensitivity to detect 3 electronic charges. In contact-charging experiments between the microscope tip and polymethyl methacrylate, the charged region was much larger than the expected contact area and bipolar charge exchange was observed.