Concepedia
Statistics
Publications
55
Citations
4.3K
H-Index
32
Active since
1983
Affiliations
University of Utah(Current)
IBM Research - Thomas J. Watson Research Center
IBM (United States)
Digital Wave (United States)
C. C. Williams is an author at University of Utah specializing in materials science, engineering, and scanning probe microscopy.
Publications per year
1983–2016
Atomic force microscope–force mapping and profiling on a sub 100-Å scale
Y. Martin, C. C. Williams, H. K. Wickramasinghe · Journal of Applied Physics · 1987 · 1.4K citations
Natural Sciences, Materials Science, Physics +17
Scanning thermal profiler
C. C. Williams, H. K. Wickramasinghe · Applied Physics Letters · 1986 · 405 citations
Engineering, Materials Engineering, Materials Science +17
TWO-DIMENSIONAL DOPANT PROFILING BY SCANNING CAPACITANCE MICROSCOPY
C. C. Williams · Annual Review of Materials Science · 1999 · 225 citations
Engineering, Electrical Engineering, Materials Science +17
Scanning capacitance microscopy on a 25 nm scale
C. C. Williams, W. P. Hough, S. A. Rishton · Applied Physics Letters · 1989 · 214 citations
Natural Sciences, Electrical Engineering, Materials Science +17
Lateral dopant profiling with 200 nm resolution by scanning capacitance microscopy
C. C. Williams, J. Slinkman, W. P. Hough et al. · Applied Physics Letters · 1989 · 167 citations
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