Ultra-high-density interconnection technology of three-dimensional packaging

Kenji Takahashi, Mitsuo Umemoto, Naotaka Tanaka, Kazumasa Tanida, Y. Nemoto, Yoshihiro TOMITA, M. Tago, Manabu Bonkohara

Microelectronics Reliability · 2003 · 80 citations · 13 references

Concepts

References

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