Microelectronics Reliability · 2003 · 80 citations · 13 references
EngineeringElectrical EngineeringMaterials ScienceElectronic MaterialsMicroelectronicsSemiconductor DevicesChip PackagingInterconnect DesignInterconnect TechnologyPackage DesignPackaging EngineeringVery-large-scale Integration Layout3D Integrated CircuitsAdvanced PackagingHigh-density InterconnectsThree-dimensional Integrated Circuit InterconnectsThree-dimensional Integrated Circuit Layout
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Three dimensional metallization for vertically integrated circuits
Peter Ramm, D. Bollmann, Rosi Braun et al. · Microelectronic Engineering · 1997 · 91 citations
Mechanical effects of copper through-vias in a 3D die-stacked module
N. Tanaka, T. Sato, Youhei Yamaji et al. · 2003 · 39 citations