Applied Physics Letters · 2013 · 37 citations · 24 references
EngineeringElectrical EngineeringMaterials ScienceOptoelectronicsSemiconductor DevicesSemiconductor MaterialsCarrier TransportLight-emitting DiodesQuantum WellsSemiconductor HeterostructuresSemiconductor PhysicsWide-bandgap Semiconductor DevicesCarrier DynamicsCarrier RelaxationCurrent DensityEfficiency DroopEmission SpectrumEnergy RelaxationHigh-energy CutoffsQuantum Well Light-emitting Diodes
A direct correlation between efficiency droop and broadening of emission spectrum of InGaN/GaN quantum wells (QWs) with increasing current density is found. A model of incomplete carrier localization in InGaN/GaN QWs is proposed. At low injection, the strong carrier localization and high-energy cutoff of emission spectrum results from fast carrier energy relaxation due to carrier hopping between localized tail states in QWs. At high level injection, the energy relaxation rate decreases due to the partial filling of tail states and high energy slope of the spectrum starts to determine by Boltzmann occupancy of tail states. This results in the incomplete carrier localization and the efficiency droop.
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Origin of efficiency droop in GaN-based light-emitting diodes
Minho Kim, M. Schubert, Qi Dai et al. · Applied Physics Letters · 2007 · 1.3K citations · Full text
Engineering, Electrical Engineering, Materials Engineering +17
Auger recombination in InGaN measured by photoluminescence
Yinchu Shen, Gerd Mueller, Satoshi Watanabe et al. · Applied Physics Letters · 2007 · 1.1K citations