Microelectronics Reliability · 2012 · 11 citations · 12 references
EngineeringElectrical EngineeringPhysicsElectronic MaterialsMicroelectronicsMicrowave EngineeringHigh-frequency Semiconductor DevicesHigh-temperature MaterialsMicrowave Integrated CircuitsRadio-frequency Integrated CircuitsHigh-temperature Device OperationHigh-temperature ElectronicsHigh-temperature RadiationPackaging For High-frequency Devices
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John D. Cressler, J.H. Comfort, E.F. Crabbé et al. · IEEE Transactions on Electron Devices · 1993 · 109 citations