Journal of Applied Physics · 2002 · 43 citations · 12 references
EngineeringLaser ApplicationsIngaas Combination LayerLaser MaterialOptoelectronic DevicesSemiconductor NanostructuresSemiconductorsSemiconductor LasersQuantum DotsCombined InalasCompound SemiconductorPhotonicsPhotoluminescencePhysicsQuantum DeviceOptoelectronic MaterialsPhotoluminescence StudyApplied PhysicsIngaas LayerOptoelectronics
We have fabricated a quantum dot (QD) structure for long-wavelength temperature-insensitive semiconductor laser by introducing a combined InAlAs and InGaAs overgrowth layer on InAs/GaAs QDs. We found that QDs formed on GaAs (100) substrate by InAs deposition followed by the InAlAs and InGaAs combination layer demonstrate two effects: one is the photoluminescence peak redshift towards 1.35 μm at room temperature, the other is that the energy separation between the ground and first excited states can be up to 103 meV. These results are attributed to the fact that InAs/GaAs intermixing caused by In segregation at substrate temperature of 520 °C can be considerably suppressed by the thin InAlAs layer and the strain in the quantum dots can be reduced by the combined InAlAs and InGaAs layer.
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Self-organized growth of regular nanometer-scale InAs dots on GaAs
J. M. Moison, F. Houzay, F. Barthe et al. · Applied Physics Letters · 1994 · 927 citations
1.3 μm room-temperature GaAs-based quantum-dot laser
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Categoryquantum Electronics, Quantum Photonics, Engineering +19
Supratik Guha, A. Madhukar, K. C. Rajkumar · Applied Physics Letters · 1990 · 660 citations