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The drain-source protected MNOS memory device and memory endurance

J.R. Cricchi, Friedrich Blaha, Michael D. Fitzpatrick

1973 · 25 citations · 1 references

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EngineeringComputer EngineeringElectrical EngineeringMemoryMicroelectronicsSemiconductor DevicesDevice CharacterizationDevice ReliabilityLeakage Power ReductionMemory DevicesMemory Protection HardwareShort-channel EffectsEnduranceEndurance CharacteristicsMemory Circuit DesignMemory ProtectionNon-volatile Memory Design

References

1

Characterization of thin-oxide MNOS memory transistors

M.H. White, J.R. Cricchi · IEEE Transactions on Electron Devices · 1972 · 199 citations

Engineering, Electrical Engineering, Materials Science +17