Microelectronics Journal · 2004 · 17 citations · 17 references
EngineeringMaterials EngineeringMaterials ScienceMaterials CharacterizationOptical MaterialsSemiconductor MaterialsPorous MaterialsSemiconductor Crystal GrowthSemiconductor Device MaterialsSemiconductor PhysicsSemiconductor SurfacesSilicon MaterialsCrystal Surface MorphologyCrystalline StructureMetalorganic Vapor Phase EpitaxyOptical CharacterizationPorous SiliconSemiconductor CharacterizationSiliconX-ray Diffraction Analysis
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The optical properties of luminescence centres in silicon
Gordon Davies · Physics Reports · 1989 · 551 citations
On the nature of the 3.41 eV luminescence in hexagonal GaN
Stefan Fischer, G. Steude, D.M. Hofmann et al. · Journal of Crystal Growth · 1998 · 79 citations