Optical Characterization

Optical Characterization is a systematic analytical approach within material characterization that employs the interaction of electromagnetic radiation with matter to determine the optical properties and electronic structure of materials, distinguishing it from other characterization methods by its reliance on optical responses such as absorption, reflection, luminescence, and refraction at macroscopic to nanoscopic scales.

6.7K

Publications

361.8K

Citations

24.1K

Authors

3.7K

Institutions

Publications per year

2017–2026

1.3K

Authors

24.1K

  1. DE
    D. E. Aspnes

    North Carolina State University, United States

    23 publications · 6.6K citations

    20

    h-index

  2. DF
    Daniel Franta

    Masaryk University, Czechia

    28 publications · 1.1K citations

    18

    h-index

  3. IY
    I.S. Yahia

    Ain Shams University, Egypt

    17 publications · 692 citations

    16

    h-index

  4. IO
    Ivan Ohlı́dal

    Masaryk University, Czechia

    22 publications · 961 citations

    16

    h-index

  5. ET
    E. T. Arakawa

    Oak Ridge National Laboratory, United States

    15 publications · 677 citations

    14

    h-index

1–5 of 24.1K

Venues

  1. Journal of Applied Physics

    376 publications · 20K citations

    71

    h-index

  2. Applied Physics Letters

    242 publications · 12.2K citations

    60

    h-index

  3. Applied Optics

    179 publications · 12.1K citations

    47

    h-index

  4. Optics Express

    162 publications · 6.8K citations

    46

    h-index

  5. Journal of the American Chemical Society

    JACS · 62 publications · 8.4K citations

    40

    h-index

1–5