Pierre-Yves Joubert

The Effect of Low Pressure on the Structure of LPCVD Polycrystalline Silicon Films

Pierre-Yves Joubert, B. Loisel, Y. Chouan et al. · Journal of The Electrochemical Society · 1987 · 174 citations

Materials Science, Engineering, Crystalline Defects +12

Mode of growth and microstructure of polycrystalline silicon obtained by solid-phase crystallization of an amorphous silicon film

L. Haji, Pierre-Yves Joubert, J. Stoëmenos et al. · Journal of Applied Physics · 1994 · 139 citations · Full text

Solid-phase Crystallization, Engineering, Preferred Orientation +19

Operating a full tungsten actively cooled tokamak: overview of WEST first phase of operation

J. Bucalossi, J. Achard, O. Agullo et al. · Nuclear Fusion · 2021 · 130 citations · Full text

Electrical Engineering, Engineering, Divertor Physics +15

Collisional parameters of H2O lines: Velocity effects on the line-shape

H. Tran, D. Bermejo, José Luis Doménech et al. · Journal of Quantitative Spectroscopy and Radiative Transfer · 2007 · 63 citations

Engineering, Physics, Mechanics +3

Characterization of subsurface defects in aeronautical riveted lap-joints using multi-frequency eddy current imaging

Yohan Le Diraison, Pierre-Yves Joubert, Dominique Placko · NDT & E International · 2008 · 60 citations

Mechanical Engineering, Engineering, Subsurface Defects