Charge distributions in silicon nitride of MNOS devices

Characterization of thin-oxide MNOS memory transistors

M.H. White, J.R. Cricchi · IEEE Transactions on Electron Devices · 1972 · 199 citations

Engineering, Electrical Engineering, Materials Science +17

Silicon nitride trap properties as revealed by charge−centroid measurements on MNOS devices

P. Arnett, B. H. Yun · Applied Physics Letters · 1975 · 155 citations

Engineering, Electrical Engineering, Materials Science +17

Properties of MNOS structures

Kent Lundström, C. Svensson · IEEE Transactions on Electron Devices · 1972 · 123 citations

Engineering, Electrical Engineering, Materials Science +15

Measurements of charge propagation in Si3N4 films

B. H. Yun · Applied Physics Letters · 1974 · 84 citations

Engineering, Electrical Engineering, Materials Science +17

Theory of MNOS memory transistor

Joseph Chang · IEEE Transactions on Electron Devices · 1977 · 57 citations

Engineering, Electrical Engineering, Microelectronics +16