Concepedia

First performance measurements and application results of a new high brightness Schottky field emitter for HR-S/TEM at 80-300kV acceleration voltage

Bert Freitag, G.M.H. Knippels, Stephan Kujawa, Michiel van der Stam, D. Hubert, PC Tiemeijer, C. Kisielowski, P. Denes, A. M. Minor, U. Dahmen

Microscopy and Microanalysis · 2008 · 20 citations · 2 references

DOI

Concepts

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

References

2

Upper limits for the residual aberrations of a high-resolution aberration-corrected STEM

M. Haider, Stephan Uhlemann, J. Żach · Ultramicroscopy · 2000 · 174 citations

, , +7

An Aberration Corrected (S)TEM Microscope for Nanoresearch

Stephan Kujawa, Bert Freitag, D. Hubert · Microscopy Today · 2005 · 10 citations · Full text

, , +15