G.M.H. Knippels

Detection of Single Atoms and Buried Defects in Three Dimensions by Aberration-Corrected Electron Microscope with 0.5-Å Information Limit

C. Kisielowski, Bert Freitag, Maarten Bischoff et al. · Microscopy and Microanalysis · 2008 · 301 citations

Engineering, Microscopy, Three Dimensions +20

Single-Shot Electron-Beam Bunch Length Measurements

Ingrid Wilke, A. M. MacLeod, W. A. Gillespie et al. · Physical Review Letters · 2002 · 218 citations

Electron-bunch Length, Physics, Measurement +14

Generation and Complete Electric-Field Characterization of Intense Ultrashort Tunable Far-Infrared Laser Pulses

G.M.H. Knippels, Xiao‐Qing Yan, A. M. MacLeod et al. · Physical Review Letters · 1999 · 100 citations

Engineering, Laser Science, Mid-infrared Laser Technology +20

Subpicosecond Electro-optic Measurement of Relativistic Electron Pulses

Xiao‐Qing Yan, A. M. MacLeod, W. A. Gillespie et al. · Physical Review Letters · 2000 · 85 citations

Photonics, Engineering, Beam Optic +14

Intense Far-Infrared Free-Electron Laser Pulses with a Length of Six Optical Cycles

G.M.H. Knippels, R.F.X.A.M. Mols, A. F. G. van der Meer et al. · Physical Review Letters · 1995 · 85 citations

Engineering, Laser Science, Laser-plasma Interaction +18