Microelectronics Reliability · 2005 · 15 citations · 3 references
EngineeringElectrical EngineeringAnalog ElectronicsMicroelectronicsSemiconductor DevicesCmos Circuit DesignComplementary Metal-oxide-semiconductor TechnologyDevice ReliabilityDevice ScalingIntegrated Circuit DesignMetal-oxide-semiconductor Field-effect TransistorsBias Temperature InstabilityCmos Analog Circuit DesignCmos Analog Integrated CircuitsCmos ReliabilityCmos ScalingDevice Mismatch AnalysisNegative Bias Temperature InstabilityProcess Variation Analysis
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A 12-bit intrinsic accuracy high-speed CMOS DAC
J. Bastos, A. Marques, Michiel Steyaert et al. · IEEE Journal of Solid-State Circuits · 1998 · 313 citations