Journal of Electronic Testing · 1995 · 40 citations · 19 references
EngineeringComputer EngineeringComputer ScienceAlgorithmsComputer ArchitectureFault-tolerant ComputingConfigurable Logic BlocksDesign For TestabilityLogic SynthesisLookup TablesRegister-transfer Level DesignTiming AnalysisFlip-flop DesignFlip-flopsPartial Scan DesignScan Chain Design
19
Designing circuits with partial scan
Vishwani D. Agrawal, Kwang‐Ting Cheng, David Johnson et al. · IEEE Design & Test of Computers · 1988 · 124 citations
Engineering, Computer Engineering, Electrical Engineering +10