1977 · 20 citations · 4 references
EngineeringElectrical EngineeringElectronic MaterialsMicroelectronicsSemiconductor DevicesDevice CharacterizationDevice ModelingDevice ReliabilityDevice SimulationShort-channel EffectsThreshold ModelingDeep DepletionDepletion LayersDepletion RegimeDepletion RegionDepletion-mode Transistors
4
Temperature dependence of the band gap of silicon
Wolfgang Bludau, A. Onton, W. Heinke · Journal of Applied Physics · 1974 · 567 citations
Effective mass and intrinsic concentration in silicon
H.D. Barber · Solid-State Electronics · 1967 · 343 citations
Very small MOSFET's for low-temperature operation
F.H. Gaensslen, V.L. Rideout, E.J. Walker et al. · IEEE Transactions on Electron Devices · 1977 · 303 citations