Thermal imaging of smart power DMOS transistors in the thermally unstable regime using a compact transient interferometric mapping system

Thermal instabilities in high current power MOS devices: experimental evidence, electro-thermal simulations and analytical modeling

P. Spirito, Giovanni Breglio, Vincenzo d’Alessandro et al. · 2003 · 51 citations

Engineering, Analytical Modeling, Power Electronics +20

Moving Current Filaments in Integrated DMOS Transistors Under Short-Duration Current Stress

M. Denison, M. Blaho, Pavel Rodin et al. · IEEE Transactions on Electron Devices · 2004 · 42 citations

Device Modeling, Electrical Engineering, Engineering +13

Measurement and Simulation of Self-Heating in DMOS Transistors up to Very High Temperatures

Martin Pfost, Joachim Joos, Matthias Stecher · 2008 · 41 citations

Engineering, Semiconductor Device, Electronic Devices +23

Detection and Optimization of Temperature Distribution Across Large-Area Power MOSFETs to Improve Energy Capability

V. Khemka, V. Parthasarathy, Ronghua Zhu et al. · IEEE Transactions on Electron Devices · 2004 · 41 citations

Engineering, Energy Efficiency, Power Optimization (Eda) +21

Scanning Heterodyne Interferometer Setup for the Time-Resolved Thermal and Free-Carrier Mapping in Semiconductor Devices

Martin Litzenberger, C. Fürböck, S. Bychikhin et al. · IEEE Transactions on Instrumentation and Measurement · 2005 · 35 citations

Engineering, Optical Transmission System, Optical Testing +21