Microelectronics Reliability · 2012 · 10 citations · 6 references
EngineeringElectrical EngineeringPower ElectronicsSemiconductor DevicesSemiconductor MaterialsCurrent-voltage CharacteristicsDevice CharacterizationDevice ModelingDevice SimulationElectric CircuitsElectronics TechnologyCurrent Density DistributionInductive CircuitsLeakage Current ModelingSaturation CurrentSwitching-induced Losses
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Thermally-driven motion of current filaments in ESD protection devices
D. Pogány, S. Bychikhin, M. Denison et al. · Solid-State Electronics · 2005 · 21 citations