Publication | Closed Access
Injection dependence of the effective lifetime of n-type Si passivated by Al2O3: An edge effect?
53
Citations
15
References
2013
Year
Materials EngineeringMaterials ScienceElectrical EngineeringAluminium NitrideEngineeringEffective LifetimeNanoelectronicsApplied PhysicsEdge EffectSemiconductor Device FabricationInjection DependenceMicroelectronicsSilicon On InsulatorSemiconductor Device
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