Off-current in polycrystalline silicon thin film transistors: An analysis of the thermally generated component

Statistics of the Recombinations of Holes and Electrons

W. Shockley, W. T. Read · Physical Review · 1952 · 6.4K citations

Engineering, Electrical Engineering, Recombination +15

Anomalous leakage current in LPCVD PolySilicon MOSFET's

J.G. Fossum, A. Ortíz-Conde, H. Shichijo et al. · IEEE Transactions on Electron Devices · 1985 · 298 citations

Engineering, Electrical Engineering, Microelectronics +16

Effects of trap-state density reduction by plasma hydrogenation in low-temperature polysilicon TFT

I‐Wen Wu, A.G. Lewis, T.Y. Huang et al. · IEEE Electron Device Letters · 1989 · 112 citations

Engineering, Electrical Engineering, Physics +16

Grain boundary states and the characteristics of lateral polysilicon diodes

H.C. de Graaff, M. T. M. Huybers, J.G. de Groot · Solid-State Electronics · 1982 · 108 citations

Engineering, Electrical Engineering, Materials Science +14

Field-effect analysis for the determination of gap-state density and Fermi-level temperature dependence in polycrystalline silicon

G. Fortunato, D. Meakin, P. Migliorato et al. · Philosophical Magazine B · 1988 · 105 citations

Engineering, Electrical Engineering, Materials Science +17