Solid-State Electronics · 1999 · 15 citations · 11 references
Electrical EngineeringSemiconductor DeviceEngineeringTunneling MicroscopyPeak Current DensityApplied PhysicsBarrier Thickness DependenceGainas/alas/inp Resonant
11
Kevin J. Chen, K. Maezawa, M. Yamamoto · IEEE Electron Device Letters · 1996 · 136 citations
Materials Engineering, Electrical Engineering, Resonant-tunneling Diodes +14
Tsuguo Inata, Shunichi Muto, Yoshiaki Nakata et al. · Japanese Journal of Applied Physics · 1987 · 108 citations
Materials Science, Room Temperature, Wide-bandgap Semiconductor +14