Japanese Journal of Applied Physics · 1987 · 108 citations · 16 references
Natural SciencesMaterials SciencePhysicsElectronic MaterialsSemiconductor DevicesSemiconductor MaterialsElectronic Band StructureQuantum TunnelingWide Band Gap SemiconductorsWide-bandgap Semiconductor DevicesWide-bandgap SemiconductorsCurrent DensityDifferential ResistanceResonant TunnelingTunnel JunctionsTunneling BarriersTunneling CurrentTunneling In SemiconductorsTunneling Phenomena
We have studied the effect of barrier height on the negative differential resistance characteristics of In 0.53 Ga 0.47 As-based resonant tunneling barriers (RTBs), including In 0.53 Ga 0.47 As/(In 0.52 Al 0.48 As) x (In 0.53 Ga 0.47 As) 1- x RTBs, lattice-matched to an InP substrate, and In 0.53 Ga 0.47 As/AlAs pseudomorphic RTBs also grown on InP substrates. A peak-to-valley current ratio of 14 (300 K) and 35 (77 K) with a high peak-current density of 2.3×10 4 A/cm 2 was achieved for a resonant tunneling barrier structure of In 0.53 Ga 0.47 As (15 atomic layers)/AlAs (9 atomic layers).
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Band structure of indium antimonide
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Tunneling in a finite superlattice
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T. C. L. G. Sollner, W. D. Goodhue, P. E. Tannenwald et al. · Applied Physics Letters · 1983 · 1.1K citations · Full text