Statistics
Publications
28
Citations
1.4K
H-Index
20
Active since
1994
B. Brar is an author at Rockwell Automation (United States) specializing in engineering, microelectronics, and electrical engineering.
Publications per year
1994–2019
28
28
SiO 2 film thickness metrology by x-ray photoelectron spectroscopy
Zhaoming Lu, J. P. McCaffrey, B. Brar et al. · Applied Physics Letters · 1997 · 225 citations
Natural Sciences, Materials Engineering, Materials Science +17
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