Radiation-induced defects in SiC-MESFETs after 2-MeV electron irradiation

H. Ohyama, Kenichiro Takakura, K. Uemura, K. Shigaki, T. Kudou, M. Arai, S. Kuboyama, Sumio Matsuda, Chihiro Kamezawa, E. Simôen,

Physica B Condensed Matter · 2006 · 21 citations · 4 references

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