Correlating defects to functional and I/sub DDQ/ tests

Abstract

Functional tests and I/sub DDQ/ tests are studied to determine their effectiveness toward screening failures. A model is presented for curve fitting correlation data between fault coverages and defect quality employing the Williams and Brown defect level to fault coverage equation. The model is used for multiple test types. Empirical data were gathered to demonstrate its effectiveness over functional and I/sub DDQ/ tests. I/sub DDQ/ test data demonstrates two categories of I/sub DDQ/ defects: pattern sensitive and pattern insensitive defects.