Concepedia

Fault Coverage Modeling

Fault Coverage Modeling is a methodological framework in fault modeling that quantifies the effectiveness of test strategies by identifying the proportion of detectable faults within a system that are actually revealed during testing.

292

Publications

12.2K

Citations

544

Authors

223

Institutions

Publications per year

2017–2026

11

Parents

Publications

292

Error detection by duplicated instructions in super-scalar processors

Nahmsuk Oh, P.P. Shirvani, E.J. McCluskey · IEEE Transactions on Reliability · 2002 · 584 citations

, , +17

Test Generation for Microprocessors

Thatte, Abraham · IEEE Transactions on Computers · 1980 · 390 citations · Full text

, , +17

Formal methods for protocol testing: a detailed study

D. Sidhu, T.-K. Leung · IEEE Transactions on Software Engineering · 1989 · 389 citations

, , +15

Defect Level as a Function of Fault Coverage

Williams, Brown · IEEE Transactions on Computers · 1981 · 348 citations

, , +17

Random Pattern Testability

J. Savir, Gary S. Ditlow, Paul H. Bardell · IEEE Transactions on Computers · 1984 · 282 citations

, , +12

1–5 of 292

Authors

544

  1. SR
    S.M. Reddy

    University of Iowa, United States

    21 publications · 710 citations

    15

    h-index

  2. VD
    Vishwani D. Agrawal

    AT&T (United States), United States

    20 publications · 764 citations

    14

    h-index

  3. IP
    Irith Pomeranz

    University of Iowa, United States

    20 publications · 642 citations

    14

    h-index

  4. JD
    J.B. Dugan

    University of Virginia, United States

    12 publications · 936 citations

    11

    h-index

  5. EM
    E.J. McCluskey

    Stanford University, United States

    9 publications · 893 citations

    9

    h-index

1–5 of 544

Institutions

223

  1. University of Iowa

    Iowa City, United States

    15 h-index

    35 publications

    1.2K citations

  2. AT&T (United States)

    Bedminster, United States

    13 h-index

    16 publications

    627 citations

  3. IBM (United States)

    Armonk, United States

    12 h-index

    21 publications

    2K citations

  4. McGill University

    Montreal, Canada

    11 h-index

    20 publications

    683 citations

  5. Purdue University West Lafayette

    West Lafayette, United States

    11 h-index

    15 publications

    450 citations

  6. University of Illinois Urbana-Champaign

    Urbana, United States

    11 h-index

    22 publications

    2.1K citations

  7. Delft University of Technology

    Delft, The Netherlands

    11 h-index

    23 publications

    1.2K citations

  8. University of Virginia

    Charlottesville, United States

    10 h-index

    17 publications

    1.1K citations

1–8 of 223

Venues

  1. 22

    h-index

  2. IEEE Transactions on Computers

    22 publications · 2.1K citations

    16

    h-index

  3. IEEE Transactions on Reliability

    9 publications · 987 citations

    9

    h-index

  4. Design Automation Conference

    Conference · 6 publications · 173 citations

    6

    h-index

  5. International Test Conference

    Conference · 5 publications · 204 citations

    5

    h-index

1–5