Infrared Thermography application to functional and failure analysis of electron devices and circuits

AlGaN/GaN HEMTs-an overview of device operation and applications

Umesh K. Mishra, P. Parikh, Yifeng Wu · Proceedings of the IEEE · 2002 · 2.2K citations

Engineering, Electrical Engineering, Materials Science +17

AlGaN/GaN HFETs fabricated on 100-mm GaN on silicon () substrates

J.D. Brown, R. Borges, E. L. Piner et al. · Solid-State Electronics · 2002 · 114 citations

Engineering, Electrical Engineering, Materials Science +11

Localization of weak heat sources in electronic devices using highly sensitive lock-in thermography

J.P. Rakotoniaina, Otwin Breitenstein, Martin Langenkamp · Materials Science and Engineering B · 2002 · 42 citations

Engineering, Electrical Engineering, Mechanical Engineering +15

Lock-in contact thermography investigation of lateral electronic inhomogeneities in semiconductor devices

Otwin Breitenstein, Martin Langenkamp · Sensors and Actuators A Physical · 1998 · 28 citations

Engineering, Electrical Engineering, Materials Science +15

Detection of localized UIS failure on IGBTs with the aid of lock-in thermography

Giovanni Breglio, Andrea Irace, Ettore Napoli et al. · Microelectronics Reliability · 2008 · 27 citations

Engineering, Electrical Engineering, Microelectronics +13